| Description |
24 samples were prepped for trace element analysis by crush and split, ceramic pulverizing and large vial surcharge. Samples analyzed for Pt, Pd, and Sn were prepped by dry sieve -150 mesh. These samples came from storage. 24 samples were analyzed by XRF for Sn. 22 samples were analyzed for Pd and Pt by DC Plasma Emission after fire assay. 24 samples were analyzed for a suite of trace elements by the following methods and digestions: INAA, ICP after HF-HNO3-HClO4 acid digestion with HCl leach and AA after HNO3-HCl hot extraction. Elevated detection levels due to high levels of REE's, Th and U. Fe, Au, Cr and Zr results listed as over the limit may be equal to or over the limit for that analysis method. |