| Description |
Majority of samples collected as chips, either continuous chip samples or random chip samples from rubble or outcrop. Occasional grab/high-grade samples also included and noted. Samples were then sent to an unspecified commercial laboratory for preparation, and forwarded to the Bureau of Mines for analysis. Samples analyzed for concentrations of Sn, Ta, and Nb by X-ray fluorescence, for concentrations of W by colorimetric procedures, for concentrations of Ag and Au by fire assay followed by inductively-coupled plasma, for Cu, Pb, and Zn by semi-quantitative emission spectrography. Selected samples analyzed for major and minor oxides by X-ray fluorescence. |