| Description |
Rock samples were taken as chip samples from a geologic unit of interest at random intervals. The area traversed by the chip sample was recorded. The chip samples were then crushed, pulverized, and analyzed. Rock chip samples were analyzed for concentrations of a suite of elements using atomic absorption techniques. Those samples were also analyzed for concentrations of a suite of elements using semi-quantitative spectrographic analysi , for U concentration using Fluorometric analysis and for concentrations of Th using colorimetric analysis techniques. Rock chip samples were analyzed for concentrations of Sn using semi-quantitative x-ray fluorescence analysis. |